On Tue, Jul 15, 2025 at 01:32:02PM +0900, Shin'ichiro Kawasaki wrote: > The test case repeats creating and deleting a loop device. This > generates many udev events and makes following test cases fail. To avoid > the unexpected test case failures, drain the udev events. For that > purpose, introduce the helper function _drain_udev_events(). When > systemd-udevd service is running, restart it to discard the events > quickly. When systemd-udevd service is not available, call > "udevadm settle", which takes longer time to drain the events. > > Link: https://github.com/linux-blktests/blktests/issues/181 > Reported-by: Yi Zhang <yi.zhang@xxxxxxxxxx> > Suggested-by: Bart Van Assche <bvanassche@xxxxxxx> > Suggested-by: Daniel Wagner <dwagner@xxxxxxx> > Signed-off-by: Shin'ichiro Kawasaki <shinichiro.kawasaki@xxxxxxx> Looks good to me. Thanks! Reviewed-by: Daniel Wagner <dwagner@xxxxxxx>
